Time-resolved x-ray excited optical luminescence in InGaN/GaN multiple quantum well structures

نویسندگان

  • S. M. O’Malley
  • P. Revesz
  • A. Kazimirov
  • A. A. Sirenko
چکیده

Synchrotron-based x-ray radiation has been utilized to measure time-resolved x-ray excited optical luminescence (TR-XEOL) from InGaN/GaN multiple quantum well (MQW) structures. Excess carrier recombination lifetimes were determined for MQWs grown on conventional c-plane as well as on non-polar m-plane substrates. In addition, the simultaneous measurement of XEOL and x-ray fluorescence reveals an interaction between inner-core excitations of Si impurities and bound exciton recombination in doped GaN-based device structures. Furthermore, the TR-XEOL characterization technique were also applied to InGaN/GaN MQWs grown on GaN inverted pyramid structures. VC 2011 American Institute of Physics. [doi:10.1063/1.3598137]

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تاریخ انتشار 2011